| Title: |
Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models |
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| Authors: |
Yibiao Yang |
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Nanjing University, Department of Computer Science and Technology
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| Yuming Zhou |
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Nanjing University, Department of Computer Science and Technology
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| Jinping Liu |
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Nanjing University, Department of Computer Science and Technology
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| Yangyang Zhao |
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Nanjing University, Department of Computer Science and Technology
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| Hongmin Lu |
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Nanjing University, Department of Computer Science and Technology
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| Lei Xu |
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Nanjing University, Department of Computer Science and Technology
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| Baowen Xu |
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Nanjing University, Department of Computer Science and Technology
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| Hareton Leung |
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The Hong Kong Polytechnic University, Department of Computing
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| Sharing: |
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| DBLP Key: |
conf/sigsoft/YangZLZL0XL16
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