IEEE/ACM International Symposium on Microarchitecture, MICRO 2016


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Title: Low-cost soft error resilience with unified data verification and fine-grained recovery for acoustic sensor based detection
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Authors: Qingrui Liu
  • Virginia Tech
Changhee Jung
  • Virginia Tech
Dongyoon Lee
  • Virginia Tech
Devesh Tiwari
  • Oak Ridge National Laboratory
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DBLP Key: conf/micro/LiuJLT16
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