IEEE International Test Conference, ITC 2016


Article Details
Title: Online slack-time binning for IO-registered die-to-die interconnects
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Authors: Chih-Chieh Zheng
  • National Tsing Hua University, Electrical Engineering Department
Shi-Yu Huang
  • National Tsing Hua University, Electrical Engineering Department
Shyue-Kung Lu
  • National Taiwan University of Science and Technology, Electrical Engineering Department
Ting-Chi Wang
  • National Tsing Hua University, Compuer Science Department
Kun-Han Tsai
  • Mentor Graphics, Silicon Test Solutions
Wu-Tung Cheng
  • Mentor Graphics, Silicon Test Solutions
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DBLP Key: conf/itc/ZhengHLWTC16
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