| Title: |
Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture |
| Article URLs: |
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| Alternative Article URLs: |
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| Authors: |
Fanchen Zhang |
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Southern Methodist University
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| Daphne Hwong |
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Southern Methodist University
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| Yi Sun |
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Southern Methodist University
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| Allison Garcia |
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Southern Methodist University
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| Soha Alhelaly |
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Southern Methodist University
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| Geoff Shofner |
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NXP Semiconductors, Austin, TX
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| LeRoy Winemberg |
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NXP Semiconductors, Austin, TX
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| Jennifer Dworak |
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Southern Methodist University
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| Artifact URLs: |
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| NSF Award Numbers: |
1061164
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| DBLP Key: |
conf/itc/ZhangHSGASWD16
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| Author Comments: |
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