IEEE International Test Conference, ITC 2016


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Title: A unified test and fault-tolerant multicast solution for network-on-chip designs
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Authors: Dong Xiang
  • Tsinghua University, School of Software
Krishnendu Chakrabarty
  • Duke University, Electrical Engineering Department
Hideo Fujiwara
  • Osaka Gakuin University, Faculty of Informatics
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DBLP Key: conf/itc/XiangCF16
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