| Title: |
Statistical outlier screening as a test solution health monitor |
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| Authors: |
David Shaw |
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Texas Instruments, Freising, Germany
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| Dirk Hoops |
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Texas Instruments, Freising, Germany
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| Kenneth M. Butler |
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Texas Instruments Inc., Dallas, TX, USA, Analog Engineering Operations
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| Amit Nahar |
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Texas Instruments Inc., Dallas, TX, USA, Analog Engineering Operations
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| NSF Award Numbers: |
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| DBLP Key: |
conf/itc/ShawHBN16
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| Author Comments: |
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