IEEE International Test Conference, ITC 2016


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Title: Fault simulation for analog test coverage
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Authors: Jyotsna Sequeira
  • Intel Corporation
Suriyaprakash Natarajan
  • Intel Corporation
Prashant Goteti
  • Intel Corporation
Nitin Chaudhary
  • Intel Corporation
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DBLP Key: conf/itc/SequeiraNGC16
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