BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning

Article Details
Title:	BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning
Article URLs:	https://doi.org/10.1109/TEST.2016.7805862
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Authors:	Mehdi Sadi	University of Florida, Dept. of Electrical & Computer Engineering
	Gustavo K. Contreras	University of Florida, Dept. of Electrical & Computer Engineering
	Dat Tran	NXP Semiconductor
	Jifeng Chen	NXP Semiconductor
	LeRoy Winemberg	NXP Semiconductor
	Mark Tehranipoor	University of Florida, Dept. of Electrical & Computer Engineering
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NSF Award Numbers:	1565404
DBLP Key:	conf/itc/SadiCTCWT16
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IEEE International Test Conference, ITC 2016