IEEE International Test Conference, ITC 2016

Article Details
Title: Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between ATE and customer board
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Authors: Toru Nakura
  • The University of Tokyo, VLSI Design and Education Center (VDEC)
Naoki Terao
  • The University of Tokyo, VLSI Design and Education Center (VDEC)
Masahiro Ishida
  • Advantest Corporation
Rimon Ikeno
  • The University of Tokyo, VLSI Design and Education Center (VDEC)
Takashi Kusaka
  • Advantest Corporation
Tetsuya Iizuka
  • The University of Tokyo, VLSI Design and Education Center (VDEC)
Kunihiro Asada
  • The University of Tokyo, VLSI Design and Education Center (VDEC)
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DBLP Key: conf/itc/NakuraTIIKIA16
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