IEEE International Test Conference, ITC 2016


Article Details
Title: I-Q signal generation techniques for communication IC testing and ATE systems
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Alternative Article URLs: http://www.el.gunma-u.ac.jp/~kobaweb/news/pdf/2016/ITC%202016-144.pdf
Authors: Masahiro Murakami
  • Gunma University, Division of Electronics and Informatics
Haruo Kobayashi
  • Gunma University, Division of Electronics and Informatics
Shaiful Nizam Bin Mohyar
  • Universiti Malaysia Perlis, Pauh Putra Campus
Osamu Kobayashi
  • D-Clue Technologies
Takahiro Miki
  • Gunma University, Division of Electronics and Informatics
Junya Kojima
  • Gunma University, Division of Electronics and Informatics
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DBLP Key: conf/itc/MurakamiKMKMK16
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