| Title: |
Test chip design for optimal cell-aware diagnosability |
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| Authors: |
Soumya Mittal |
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Carnegie Mellon University, Department of Electrical and Computer Engineering
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| Zeye Liu |
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Carnegie Mellon University, Department of Electrical and Computer Engineering
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| Ben Niewenhuis |
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Carnegie Mellon University, Department of Electrical and Computer Engineering
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| R. D. (Shawn) Blanton |
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Carnegie Mellon University, Department of Electrical and Computer Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| NSF Award Numbers: |
1527606
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| DBLP Key: |
conf/itc/MittalLNB16
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| Author Comments: |
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