Minimal area test points for deterministic patterns

Article Details
Title:	Minimal area test points for deterministic patterns
Article URLs:	https://doi.org/10.1109/TEST.2016.7805825
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Authors:	Yingdi Liu	University of Iowa
	Elham K. Moghaddam	Mentor Graphics Corporation
	Nilanjan Mukherjee	Mentor Graphics Corporation
	Sudhakar M. Reddy	University of Iowa
	Janusz Rajski	Mentor Graphics Corporation
	Jerzy Tyszer	Poznań University of Technology
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DBLP Key:	conf/itc/LiuMMRRT16
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IEEE International Test Conference, ITC 2016