| Title: |
Defect tolerance for CNFET-based SRAMs |
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| Authors: |
Tianjian Li |
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Shanghai Jiao Tong University, Department of Computer Science & Engineering
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| Li Jiang |
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Shanghai Jiao Tong University, Department of Computer Science & Engineering
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| Xiaoyao Liang |
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Shanghai Jiao Tong University, Department of Computer Science & Engineering
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| Qiang Xu |
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The Chinese University of Hong Kong, Department of Computer Science & Engineering
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| Krishnendu Chakrabarty |
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Duke University, Department of Electrical and Computer Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
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none
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| DBLP Key: |
conf/itc/LiJLXC16
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