| Title: |
An on-chip self-test architecture with test patterns recorded in scan chains |
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| Authors: |
Kuen-Jong Lee |
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National Cheng Kung University, Department of Electrical Engineering
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| Pin-Hao Tang |
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National Cheng Kung University, Department of Electrical Engineering
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| Michael A. Kochte |
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University of Stuttgart, ITI
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National Cheng Kung University, Department of Electrical Engineering
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| Sharing: |
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| DBLP Key: |
conf/itc/LeeTK16
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