| Title: |
Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors |
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| Authors: |
Michael Johnson |
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IBM Systems and Technology Group
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| Brian Noble |
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IBM Systems and Technology Group
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| Mark Johnson |
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IBM Systems and Technology Group
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| Jim Crafts |
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IBM Systems and Technology Group
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| Cynthia Manya |
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IBM Systems and Technology Group
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| John Deforge |
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IBM Systems and Technology Group
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| DBLP Key: |
conf/itc/JohnsonNJCMD16
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| Author Comments: |
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