| Title: |
Variation and failure characterization through pattern classification of test data from multiple test stages |
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| Authors: |
Chun-Kai Hsu |
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University of California - Santa Barbara
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| Peter Sarson |
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ams AG, Premstaetten, Austria
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| Gregor Schatzberger |
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ams AG, Premstaetten, Austria
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| Friedrich Peter Leisenberger |
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ams AG, Premstaetten, Austria
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| John M. Carulli Jr. |
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GlobalFoundries, Malta, New York, USA
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| Siddhartha Siddhartha |
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GlobalFoundries, Malta, New York, USA
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| Kwang-Ting Cheng |
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University of California - Santa Barbara
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Hong Kong University of Science and Technology (HKUST)
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| Sharing: |
Unknown
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| Verification: |
Authors have
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none
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| DBLP Key: |
conf/itc/HsuSSLCSC16
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| Author Comments: |
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