IEEE International Test Conference, ITC 2016


Article Details
Title: A built-in self-repair scheme for DRAMs with spare rows, columns, and bits
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Authors: Chih-Sheng Hou
  • National Central University, Department of Electrical Engineering
Yong-Xiao Chen
  • National Central University, Department of Electrical Engineering
Jin-Fu Li
  • National Central University, Department of Electrical Engineering
Chih-Yen Lo
  • Industrial Technology Research Institute, Information and Communication Research Laboratories
Ding-Ming Kwai
  • Industrial Technology Research Institute, Information and Communication Research Laboratories
Yung-Fa Chou
  • Industrial Technology Research Institute, Information and Communication Research Laboratories
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DBLP Key: conf/itc/HouCLLKC16
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