Logic characterization vehicle design reflection via layout rewiring

Article Details
Title:	Logic characterization vehicle design reflection via layout rewiring
Article URLs:	https://doi.org/10.1109/TEST.2016.7805849
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Authors:	Phillip Fynan	Carnegie Mellon University, Advanced Chip Testing Laboratory, Department of Electrical and Computer Engineering
	Zeye Liu	Carnegie Mellon University, Advanced Chip Testing Laboratory, Department of Electrical and Computer Engineering
	Benjamin Niewenhuis	Carnegie Mellon University, Advanced Chip Testing Laboratory, Department of Electrical and Computer Engineering
	Soumya Mittal	Carnegie Mellon University, Advanced Chip Testing Laboratory, Department of Electrical and Computer Engineering
	Marcin Strajwas	PDF Solutions Inc.
	R. D. (Shawn) Blanton	Carnegie Mellon University, Advanced Chip Testing Laboratory, Department of Electrical and Computer Engineering
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DBLP Key:	conf/itc/FynanLNMSB16
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IEEE International Test Conference, ITC 2016