RF test accuracy and capacity enhancement on ATE for silicon TV tuners

Article Details
Title:	RF test accuracy and capacity enhancement on ATE for silicon TV tuners
Article URLs:	https://doi.org/10.1109/TEST.2016.7805842
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Authors:	Y. Fan	Silicon Test Solutions
	A. Verma	Silicon Test Solutions
	Y. Su	Silicon Test Solutions
	L. Rose	Silicon Test Solutions
	J. Janney	Silicon Test Solutions
	V. Do	Silicon Test Solutions
	S. Kumar	Silicon Test Solutions
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DBLP Key:	conf/itc/FanVSRJDK16
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IEEE International Test Conference, ITC 2016