| Title: |
Effective DC fault models and testing approach for open defects in analog circuits |
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| Authors: |
Baris Esen |
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KU Leuven, Department of Electrical Engineering (ESAT)
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| Anthony Coyette |
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KU Leuven, Department of Electrical Engineering (ESAT)
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| Georges G. E. Gielen |
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KU Leuven, Department of Electrical Engineering (ESAT)
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| Wim Dobbelaere |
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ON Semiconductor Belgium, APG Automotive Mixed Signal
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| Ronny Vanhooren |
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ON Semiconductor Belgium, APG Automotive Mixed Signal
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| DBLP Key: |
conf/itc/EsenCGDV16
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| Author Comments: |
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