| Title: |
Analog fault coverage improvement using final-test dynamic part average testing |
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| Authors: |
Wim Dobbelaere |
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ON Semiconductor Belgium, APG Automotive Mixed Signal
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| Ronny Vanhooren |
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ON Semiconductor Belgium, APG Automotive Mixed Signal
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| Willy De Man |
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ON Semiconductor Belgium, APG Automotive Mixed Signal
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| Koen Matthijs |
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ON Semiconductor Belgium, APG Automotive Mixed Signal
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| Anthony Coyette |
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| Baris Esen |
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| Georges G. E. Gielen |
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| NSF Award Numbers: |
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| DBLP Key: |
conf/itc/DobbelaereVMMCE16
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| Author Comments: |
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