Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis

Article Details
Title:	Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis
Article URLs:	https://doi.org/10.1109/TEST.2016.7805867
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Authors:	Anthony Coyette	KU Leuven, Department of Electrical Engineering
	Baris Esen	KU Leuven, Department of Electrical Engineering
	Wim Dobbelaere	ON Semiconductor Belgium
	Ronny Vanhooren	ON Semiconductor Belgium
	Georges G. E. Gielen	KU Leuven, Department of Electrical Engineering
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DBLP Key:	conf/itc/CoyetteEDVG16
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IEEE International Test Conference, ITC 2016