ACM International Symposium on Physical Design, ISPD 2017


Article Details
Title: Bilinear Lithography Hotspot Detection
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Authors: Hang Zhang
  • The Chinese University of Hong Kong Shatin N.T., Hong Kong, Department of Computer Science and Engineering
Fengyuan Zhu
  • The Chinese University of Hong Kong Shatin N.T., Hong Kong, Department of Computer Science and Engineering
Haocheng Li
  • The Chinese University of Hong Kong Shatin N.T., Hong Kong, Department of Computer Science and Engineering
Evangeline F. Y. Young
  • The Chinese University of Hong Kong Shatin N.T., Hong Kong, Department of Computer Science and Engineering
Bei Yu
  • The Chinese University of Hong Kong Shatin N.T., Hong Kong, Department of Computer Science and Engineering
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DBLP Key: conf/ispd/ZhangZLYY17
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