| Title: |
XED: Exposing On-Die Error Detection Information for Strong Memory Reliability |
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| Authors: |
Prashant J. Nair |
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Georgia Institute of Technology, School of Electrical and Computer Engineering
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| Vilas Sridharan |
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Advanced Micro Devices Inc., RAS Architecture
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| Moinuddin K. Qureshi |
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Georgia Institute of Technology, School of Electrical and Computer Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| NSF Award Numbers: |
1319587
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| DBLP Key: |
conf/isca/NairSQ16
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| Author Comments: |
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