ACM International Conference on Computer-Aided Design, ICCAD 2016


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Title: Enabling online learning in lithography hotspot detection with information-theoretic feature optimization
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Authors: Hang Zhang
  • The Chinese University of Hong Kong, Department of Computer Science and Engineering
Bei Yu
  • The Chinese University of Hong Kong, Department of Computer Science and Engineering
Evangeline F. Y. Young
  • The Chinese University of Hong Kong, Department of Computer Science and Engineering
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DBLP Key: conf/iccad/ZhangYY16
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