ACM International Conference on Computer-Aided Design, ICCAD 2016


Article Details
Title: Efficient statistical analysis for correlated rare failure events via asymptotic probability approximation
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Authors: Handi Yu
  • Fudan University, ASIC and System State Key Lab
  • Fudan University, Department of Microelectronics
Jun Tao
  • Fudan University, ASIC and System State Key Lab
  • Fudan University, Department of Microelectronics
Changhai Liao
  • Fudan University, ASIC and System State Key Lab
  • Fudan University, Department of Microelectronics
Yangfeng Su
  • Fudan University, School of Mathematical Sciences
Dian Zhou
  • Fudan University, ASIC and System State Key Lab
  • Fudan University, Department of Microelectronics
  • University of Texas at Dallas, Dept. of EE
Xuan Zeng
  • Fudan University, ASIC and System State Key Lab
  • Fudan University, Department of Microelectronics
Xin Li
  • Carnegie Mellon University, Dept. of ECE
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NSF Award Numbers: 1115556, 1148778
DBLP Key: conf/iccad/YuTLSZZ016
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