| Title: |
Voltage-based electromigration immortality check for general multi-branch interconnects |
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| Authors: |
Zeyu Sun |
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University of California - Riverside, Department of Electrical and Computer Engineering
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| Ertugrul Demircan |
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NXP Semiconductors, Physical Veriļ¬cation Group
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| Mehul D. Shroff |
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NXP Semiconductors, Intrinsic Reliability Group
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| Taeyoung Kim |
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University of California - Riverside, Department of Computer Science and Engineering
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| Xin Huang |
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University of California - Riverside, Department of Electrical and Computer Engineering
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| Sheldon X.-D. Tan |
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University of California - Riverside, Department of Electrical and Computer Engineering
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| Sharing: |
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| NSF Award Numbers: |
1255899,
1527324
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| DBLP Key: |
conf/iccad/SunDSKHT16
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| Author Comments: |
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