ACM International Conference on Computer-Aided Design, ICCAD 2016


Article Details
Title: Voltage-based electromigration immortality check for general multi-branch interconnects
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Authors: Zeyu Sun
  • University of California - Riverside, Department of Electrical and Computer Engineering
Ertugrul Demircan
  • NXP Semiconductors, Physical Veriļ¬cation Group
Mehul D. Shrof
  • NXP Semiconductors, Intrinsic Reliability Group
Taeyoung Kim
  • University of California - Riverside, Department of Computer Science and Engineering
Xin Huang
  • University of California - Riverside, Department of Electrical and Computer Engineering
Sheldon X.-D. Tan
  • University of California - Riverside, Department of Electrical and Computer Engineering
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NSF Award Numbers: 1255899, 1527324
DBLP Key: conf/iccad/SunDSKHT16
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