| Title: |
Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax |
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| Authors: |
Szu-Pang Mu |
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National Chiao-Tung University, Dept. of Electronics Engineering
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National Chiao-Tung University, Institute of Electronics
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| Wen-Hsiang Chang |
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National Chiao-Tung University, Department of Electronics Engineering
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National Chiao-Tung University, Institute of Electronics
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| Mango C.-T. Chao |
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National Chiao-Tung University, Dept. of Electronics Engineering
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National Chiao-Tung University, Institute of Electronics
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| Yi-Ming Wang |
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Global Unichip Corporation
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| Ming-Tung Chang |
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Global Unichip Corporation
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| Min-Hsiu Tsai |
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Global Unichip Corporation
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| DBLP Key: |
conf/iccad/MuCCWCT16
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| Author Comments: |
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