| Title: |
Dynamic reliability management for near-threshold dark silicon processors |
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| Alternative Article URLs: |
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| Authors: |
Taeyoung Kim |
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University of California - Riverside, Department of Computer Science and Engineering
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| Zeyu Sun |
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University of California - Riverside, Department of Electrical and Computer Engineering
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| Chase Cook |
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University of California - Riverside, Department of Electrical and Computer Engineering
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| Jagadeesh Gaddipati |
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University of California - Riverside, Department of Electrical and Computer Engineering
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| Hai Wang |
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UETSC, School of Microelectronics and Solid-State Electronics
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| Hai-Bao Chen |
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Shanghai Jiao Tong University, Department of Micro/Nano-electronics
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| Sheldon X.-D. Tan |
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University of California - Riverside, Department of Electrical and Computer Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| Artifact Correspondence Email Addresses: |
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| NSF Award Numbers: |
1255899,
1527324
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| DBLP Key: |
conf/iccad/KimSCGWCT16
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| Author Comments: |
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