ACM International Conference on Computer-Aided Design, ICCAD 2016

Article Details
Title: Efficient yield estimation through generalized importance sampling with application to NBL-assisted SRAM bitcells
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Authors: Lorenzo Ciampolini
  • STMicroelectronics, FEM&PR&D
  • STMicroelectronics, PIMDS
  • STMicroelectronics, VLSI dept
Jean-Christophe Lafont
  • STMicroelectronics, FEM&PR&D
  • STMicroelectronics, PIMDS
  • STMicroelectronics, VLSI dept
Faress Tissafi Drissi
  • STMicroelectronics, FEM&PR&D
  • STMicroelectronics, PIMDS
  • STMicroelectronics, VLSI dept
Jean-Paul Morin
  • STMicroelectronics, FEM&PR&D
  • STMicroelectronics, PIMDS
  • STMicroelectronics, VLSI dept
David Turgis
  • STMicroelectronics, FEM&PR&D
  • STMicroelectronics, PIMDS
  • STMicroelectronics, VLSI dept
Xavier Jonsson
  • Mentor Graphics, DSM/AMS
Cyril Desclèves
  • Mentor Graphics, DSM/AMS
Joseph Nguyen
  • INPG, IMEP-LAHC
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DBLP Key: conf/iccad/CiampoliniLDMTJ16
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