ACM International Conference on Computer-Aided Design, ICCAD 2016

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Title: Fast physics-based electromigration checking for on-die power grids
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Authors: Sandeep Chatterjee
  • University of Toronto, ECE Department
Valeriy Sukharev
  • Mentor Graphics Corporation
Farid N. Najm
  • University of Toronto, ECE Department
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DBLP Key: conf/iccad/ChatterjeeSN16
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