IEEE International Symposium on High Performance Computer Architecture, HPCA 2018

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Title: DUO: Exposing On-Chip Redundancy to Rank-Level ECC for High Reliability
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Authors: Seong-Lyong Gong
  • UT Austin
Jungrae Kim
  • Microsoft
Sangkug Lym
  • UT Austin
Michael B. Sullivan
Howard David
  • Huawei
Mattan Erez
  • UT Austin
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DBLP Key: conf/hpca/GongKLSDE18
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