Design Automation Conference, DAC 2016


Article Details
Title: Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture
Article URLs:
Alternative Article URLs:
Authors: Deepashree Sengupta
  • University of Minnesota, Minneapolis, MN, USA, Department of Electrical and Computer Engineering
Vivek Mishra
  • University of Minnesota, Minneapolis, MN, USA, Department of Electrical and Computer Engineering
Sachin S. Sapatnekar
  • University of Minnesota, Minneapolis, MN, USA, Department of Electrical and Computer Engineering
Sharing: Unknown
Verification: Authors have not verified information
Artifact Evaluation Badge: none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers: 1017778, 1162267
DBLP Key: conf/dac/SenguptaMS16
Author Comments:

Discuss this paper and its artifacts below