| Title: |
Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture |
| Article URLs: |
|
| Alternative Article URLs: |
|
| Authors: |
Deepashree Sengupta |
-
University of Minnesota, Minneapolis, MN, USA, Department of Electrical and Computer Engineering
|
| Vivek Mishra |
-
University of Minnesota, Minneapolis, MN, USA, Department of Electrical and Computer Engineering
|
| Sachin S. Sapatnekar |
-
University of Minnesota, Minneapolis, MN, USA, Department of Electrical and Computer Engineering
|
| Sharing: |
Unknown
|
| Verification: |
Authors have
not verified
information
|
| Artifact Evaluation Badge: |
none
|
| Artifact URLs: |
|
| Artifact Correspondence Email Addresses: |
|
| NSF Award Numbers: |
1017778,
1162267
|
| DBLP Key: |
conf/dac/SenguptaMS16
|
| Author Comments: |
|