Design Automation Conference, DAC 2016


Article Details
Title: Relevance vector and feature machine for statistical analog circuit characterization and built-in self-test optimization
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Authors: Honghuang Lin
  • Texas A&M University, Department of Electrical and Computer Engineering
Peng Li
  • Texas A&M University, Department of Electrical and Computer Engineering
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NSF Award Numbers: 1117660
DBLP Key: conf/dac/LinL16
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