| Article Details | ||
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| Title: | Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification | |
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| Authors: | Doowon Lee |
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| Tom Kolan |
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| Arkadiy Morgenshtein |
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| Vitali Sokhin |
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| Ronny Morad |
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| Avi Ziv |
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| Valeria Bertacco |
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| Sharing: | Unknown | |
| Verification: | Authors have not verified information | |
| Artifact Evaluation Badge: | none | |
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| DBLP Key: | conf/dac/LeeKMSMZB16 | |
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