| Article Details | ||
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| Title: | Test Methodology for Dual-rail Asynchronous Circuits | |
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| Authors: | Kuan-Yen Huang |
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| Ting-Yu Shen |
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| Chien-Mo James Li |
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| Sharing: | Unknown | |
| Verification: | Authors have not verified information | |
| Artifact Evaluation Badge: | none | |
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| DBLP Key: | conf/dac/HuangSL17 | |
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