Design Automation Conference, DAC 2017


Article Details
Title: Fogging Effect Aware Placement in Electron Beam Lithography
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Authors: Yu-Chen Huang
  • National Taiwan University, Graduate Institute of Electronics Engineering
Yao-Wen Chang
  • National Taiwan University, Graduate Institute of Electronics Engineering
  • National Taiwan University, Department of Electrical Engineering
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DBLP Key: conf/dac/HuangC17
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