Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery

Article Details
Title:	Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery
Article URLs:	https://doi.org/10.1145/3061639.3062271
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Authors:	Kuo-Kai Hsieh	University of California - Santa Barbara
	Li-C. Wang	University of California, Santa Barbara
	Wen Chen	NXP Semiconductors
	Jayanta Bhadra	NXP Semiconductors, Inc.
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DBLP Key:	conf/dac/HsiehWCB17
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Design Automation Conference, DAC 2017