| Title: |
On Characterizing Near-Threshold SRAM Failures in FinFET Technology |
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| Authors: |
Shrikanth Ganapathy |
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Advanced Micro Devices, Inc., AMD Research
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| John Kalamatianos |
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Advanced Micro Devices, Inc., AMD Research
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| Keith Kasprak |
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Advanced Micro Devices, Inc, Cores Group
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| Steven Raasch |
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Advanced Micro Devices, Inc., AMD Research
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| NSF Award Numbers: |
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| DBLP Key: |
conf/dac/GanapathyKKR17
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| Author Comments: |
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