See No Evil, Hear No Evil, Feel No Evil, Print No Evil? Malicious Fill Patterns Detection in Additive Manufacturing

Article Details
Title:	See No Evil, Hear No Evil, Feel No Evil, Print No Evil? Malicious Fill Patterns Detection in Additive Manufacturing
Article URLs:	https://www.usenix.org/conference/usenixsecurity17/technical-sessions/presentation/bayens
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Authors:	Christian Bayens	Georgia Institute of Technology
	Tuan Le	Rutgers University
	Luis Garcia	Rutgers University
	Raheem A. Beyah	Georgia Institute of Technology
	Mehdi Javanmard	Rutgers University
	Saman A. Zonouz	Rutgers University
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NSF Award Numbers:	1453046
DBLP Key:	conf/uss/BayensLGBJZ17
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USENIX Security Symposium, USENIX Security 2017