| Title: |
Better test cases for better automated program repair |
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| Authors: |
Jinqiu Yang |
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University of Waterloo, Electrical and Computer Engineering
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| Alexey Zhikhartsev |
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University of Waterloo, Electrical and Computer Engineering
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| Yuefei Liu |
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University of Waterloo, Electrical and Computer Engineering
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| Lin Tan |
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University of Waterloo, Electrical and Computer Engineering
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| DBLP Key: |
conf/sigsoft/YangZLT17
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| Author Comments: |
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