| Title: |
Heterogeneous cross-company defect prediction by unified metric representation and CCA-based transfer learning |
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| Authors: |
Xiao-Yuan Jing |
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Wuhan University, State Key Laboratory of Software Engineering
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Wuhan University, School of Computer
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Nanjing University of Posts and Telecommunications, School of Automation
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| Fei Wu |
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Wuhan University, State Key Laboratory of Software Engineering
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Wuhan University, School of Computer
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Nanjing University of Posts and Telecommunications, School of Automation
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| Xiwei Dong |
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Wuhan University, State Key Laboratory of Software Engineering
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Wuhan University, School of Computer
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Nanjing University of Posts and Telecommunications, School of Automation
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| Fumin Qi |
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Wuhan University, State Key Lab of Software Engineering
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Wuhan University, School of Computer
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| Baowen Xu |
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Wuhan University, State Key Lab of Software Engineering
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Wuhan University, School of Computer
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Nanjing University, Department of Computer Science and Technology
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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none
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| DBLP Key: |
conf/sigsoft/JingWDQX15
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