| Title: |
Characterizing 3D Floating Gate NAND Flash |
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| Authors: |
Qin Xiong |
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Huazhong University of Science and Technology, Wuhan, China, Wuhan National Laboratory for Optoelectronics
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| Fei Wu |
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Huazhong University of Science and Technology, Wuhan, China, Wuhan National Laboratory for Optoelectronics
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| Zhonghai Lu |
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KTH Royal Institute of Technology, Stockholm, Sweden, School of Information and Communication Technology
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| Yue Zhu |
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Huazhong University of Science and Technology, Wuhan, China, Wuhan National Laboratory for Optoelectronics
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| You Zhou |
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Huazhong University of Science and Technology, Wuhan, China, Wuhan National Laboratory for Optoelectronics
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| Yibing Chu |
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Renice Technology Co. Limited, China
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| Changsheng Xie |
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Huazhong University of Science and Technology, Wuhan, China, Wuhan National Laboratory for Optoelectronics
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| Ping Huang |
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Temple University, Department of Computer Information Sciences
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| Sharing: |
Unknown
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| Verification: |
Authors have
not verified
information
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| Artifact Evaluation Badge: |
none
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| DBLP Key: |
conf/sigmetrics/XiongWLZZCXH17
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