ACM Intl. Conf. on Measurement and Modeling of Comp. Sys., SIGMETRICS 2016


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Title: Contrasting Effects of Replication in Parallel Systems: From Overload to Underload and Back
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Authors: Felix Poloczek
  • University of Warwick
  • TU Berlin
Florin Ciucu
  • University of Warwick
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DBLP Key: conf/sigmetrics/PoloczekC16
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