ACM Intl. Conf. on Measurement and Modeling of Comp. Sys., SIGMETRICS 2016

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Title: SSD Failures in Datacenters: What, When and Why?
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Authors: Iyswarya Narayanan
  • Pennsylvania State University
Di Wang
  • Microsoft Corporation
Myeongjae Jeon
  • Microsoft Corporation
Bikash Sharma
  • Microsoft Corporation
Laura Caulfield
  • Microsoft Corporation
Anand Sivasubramaniam
  • Pennsylvania State University
Ben Cutler
  • Microsoft Corporation
Jie Liu
  • Microsoft Corporation
Badriddine M. Khessib
  • Microsoft Corporation
Kushagra Vaid
  • Microsoft Corporation
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NSF Award Numbers: 1302225, 1302557
DBLP Key: conf/sigmetrics/NarayananWJSCSC16
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