Understanding Reduced-Voltage Operation in Modern DRAM Devices: Experimental Characterization, Analysis, and Mechanisms

Article Details
Title:	Understanding Reduced-Voltage Operation in Modern DRAM Devices: Experimental Characterization, Analysis, and Mechanisms
Article URLs:	https://doi.org/10.1145/3078505.3078590
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Authors:	Kevin K. Chang	Carnegie Mellon University
	Abdullah Giray Yaglikçi	Carnegie Mellon University
	Saugata Ghose	Carnegie Mellon University
	Aditya Agrawal	NVIDIA
	Niladrish Chatterjee	NVIDIA
	Abhijith Kashyap	NVIDIA
	Donghyuk Lee	NVIDIA
	Mike O'Connor	University of Texas at Austin
	Hasan Hassan	ETH Zürich
	Onur Mutlu	ETH Zürich Carnegie Mellon University
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DBLP Key:	conf/sigmetrics/ChangYGACKLOHM17
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ACM Intl. Conf. on Measurement and Modeling of Comp. Sys., SIGMETRICS 2017