ACM Intl. Conf. on Measurement and Modeling of Comp. Sys., SIGMETRICS 2017


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Title: Understanding Reduced-Voltage Operation in Modern DRAM Devices: Experimental Characterization, Analysis, and Mechanisms
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Authors: Kevin K. Chang
  • Carnegie Mellon University
Abdullah Giray Yaglikçi
  • Carnegie Mellon University
Saugata Ghose
  • Carnegie Mellon University
Aditya Agrawal
  • NVIDIA
Niladrish Chatterjee
  • NVIDIA
Abhijith Kashyap
  • NVIDIA
Donghyuk Lee
  • NVIDIA
Mike O'Connor
  • University of Texas at Austin
Hasan Hassan
  • ETH Zürich
Onur Mutlu
  • ETH Zürich
  • Carnegie Mellon University
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DBLP Key: conf/sigmetrics/ChangYGACKLOHM17
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