ACM Intl. Conf. on Measurement and Modeling of Comp. Sys., SIGMETRICS 2017

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Title: Delay Scalings and Mean-Field Limits in Networked Systems
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Authors: Sem C. Borst
  • Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands
  • Nokia Bell Labs, Murray Hill, NJ 07974, USA
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DBLP Key: conf/sigmetrics/Borst17
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