| Title: |
Quantitatively Modeling Application Resilience with the Data Vulnerability Factor |
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| Authors: |
Li Yu |
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Illinois Institute of Technology
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| Dong Li |
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Oak Ridge National Laboratory
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| Sparsh Mittal |
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Oak Ridge National Laboratory
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| Jeffrey S. Vetter |
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Oak Ridge National Laboratory
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Georgia Institute of Technology
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| Sharing: |
Unknown
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| Verification: |
Authors have
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none
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| DBLP Key: |
conf/sc/YuLMV14
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| Author Comments: |
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