ACM/IEEE Intl. Conf. for High Perf. Computing, Networking, Storage and Analysis, SC 2017

Article Details
Title: Experimental and analytical study of Xeon Phi reliability
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Authors: Daniel A. G. de Oliveira
  • UFRGS, Institute of Informatics
Laércio Lima Pilla
  • UFSC, Department of Informatics and Statistics
Nathan DeBardeleben
  • Los Alamos National Laboratory
Sean Blanchard
  • Los Alamos National Laboratory
Heather Quinn
  • Los Alamos National Laboratory
Israel Koren
  • University of Massachusetts
Philippe O. A. Navaux
  • UFRGS, Institute of Informatics
Paolo Rech
  • UFRGS, Institute of Informatics
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DBLP Key: conf/sc/OliveiraPDBQKNR17
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