An Image-Based Approach to Extreme Scale in Situ Visualization and Analysis

Article Details
Title:	An Image-Based Approach to Extreme Scale in Situ Visualization and Analysis
Article URLs:	https://doi.org/10.1109/SC.2014.40 http://doi.ieeecomputersociety.org/10.1109/SC.2014.40
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Authors:	James P. Ahrens	Los Alamos National Laboratory
	Sébastien Jourdain	Kitware Inc
	Patrick O'Leary	Kitware Inc
	John Patchett	Los Alamos National Laboratory
	David H. Rogers	Los Alamos National Laboratory
	Mark Petersen	Los Alamos National Laboratory
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DBLP Key:	conf/sc/AhrensJOPRP14
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ACM/IEEE Intl. Conf. for High Perf. Computing, Networking, Storage and Analysis, SC 2014